Shuhei FukayaI joined the company as a semiconductor process engineer in the SiC division, where I first encountered JMP. My daily work involved visualizing the distribution of semiconductor electrical properties to improve yield. Working with large amounts of data, I felt the need for automation and developed a JMP add-in that allows for batch graph creation. This automation tool was released internally and is now widely used by approximately 100 people. Later, I transferred to my current department and am involved in building a data infrastructure for analysis. I have been responsible for designing the architecture from data acquisition to processing and user provision, with the aim of improving yield and investigating defect causes. Currently, I am working on creating an infrastructure that combines data warehousing and AI to more effectively utilize large amounts of data for analysis.
SiC Power Devices Business Unit, SiC Production Management, SiCWP Technology Department, Digital Solutions Section, Technical Staff - ROHM Co., Ltd.
