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Koichi Endo

He has worked as an engineer at Toshiba Corporation and Toshiba Electronic Devices & Storage Corporation in the fields of semiconductor device development, reliability technology, and failure analysis technology. Due to its high analytical capabilities, he uses JMP for reliability analysis and data analysis, and is looking for new analytical approaches.Since 2021, he has been engaged in research on reliability evaluation of SiC devices at the National Institute of Advanced Industrial Science and Technology, while also giving lectures at the University of Electro-Communications and other institutions.

National Institute of Advanced Industrial Science and Technology, University of Electro-Communications

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