Pinpointing and Reducing Defects
See how to:
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Reduce spatial defect data to a few key clusters
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Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements
See how to:
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Examine multildimensional defects by going from a 2D to a 3D view of the defect
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Visually explore 3D views using Scatterplot 3D
Resources
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