What inspired this Wish List Request?
The aim is to filter the data and remove outliers in order to set aside wafers with many defects and identify the standard. the data follows a poisson distribution
Please describe the new or improved feature or solution you would like to see.
they would like to detect outlier by using iterative 3 sigmas approach.
it means:
- Measure mean and standard deviation of samples.
- Remove samples higher than mean plus 3 standard deviations.
- Repeat from Step 1 - for a total of 3 times.
What would the value be to you and/or other users if this new feature is provided?
Is this an external customer request?
STMicroelectronics - Crolles
Is there a competitive software package that has this feature or solution that we should be aware of?
Don't know
Will this impact a renewal, expansion, or adoption at a customer, and does this put an account at risk if we do not address this?
On-going ELA at STMicroelectronics