Level: Beginner, Intermediate
When you buy a car, smartphone, or dishwasher, what do you look for in that product? Most people want it to work without problems over the long term—in other words, high reliability. Reliability testing is difficult for manufacturers because the time available to prove long-term reliability is limited. For example, to prove that a product will work without problems for the next 12 years, they may only have one year to test it. Ensuring high reliability when designing the latest products is an engineering challenge. And in the field of product reliability, statistical methods play a crucial role.
Modern product design and manufacturing employ a proactive design process known as "Reliability by Design" or "Design for Reliability." This process requires quantitative methods to provide early information about the causes of failure, methods to evaluate and predict product reliability, and meticulous planning to acquire the most meaningful data for analysis in a timely manner. This presentation will introduce statistical methods for reliability and how JMP can help develop highly reliable products.
Dr. Bill Meeker is a professor of statistics and a Distinguished Professor of the College of Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association (ASA) and the American Society for Quality (ASQ), and a former editor of Technometrics magazine. He has co-authored numerous books, including "Statistical Methods for Reliability Data" (1998, with Luis Escobar) and "Statistical Intervals: A Guide for Practitioners" (1991, with Gerald Hahn). He has also published many papers in engineering and statistics literature. He has received the ASQ Youden Award four times and the Wilcoxon Award three times. In 2001, he received the ASA Best Practical Application Award, and in 2003, the ASQ Statistics WGHunter Award. He also received the ASQ Shewhart Medal in 2007. Dr. Meeker conducts extensive research and consulting on issues such as reliability data analysis, reliability test planning, accelerated testing, non-destructive evaluation, and statistical calculations.
・Special interview (in Japanese)
• Keynote speech (in Japanese)
• Special interview (in English)
• Keynote speech (in English)
