To make a single semiconductor, numerous unit processes must be performed.
Each process must be carried out well to obtain high-quality semiconductors, and this is managed through measurement between processes. However, since it exists in various forms depending on the equipment and FAB, consistent analysis is difficult.
Here, we present a case study that allows anyone to perform consistent analysis quickly and easily using JSL.
It predicts the distribution of RESPONSE within WAFER with limited data and provides statistical information.
Additionally, it provides a visual representation of the interactive analysis results.
