Level: Intermediate
In situations of IP sensitivity, the ability to provide guidance to supplier for continued process improvement is challenged. This presentation introduces a methodology to address this. It uses retrospective analysis to separate the special cause from common cause, leading to establishment of achievable process target with improved controls and performance capability. JMP tools like ANOVA, each pair t-test, 3 way control chart, and goal plot are fundamental instruments to this methodology.
Intellectual property-sensitive situations challenge the ability to provide suppliers with guidance for continuous process improvement. This presentation introduces a methodology to address this issue. Use post-hoc analysis to isolate specific and common causes and establish achievable process goals with improved control and performance capabilities. JMP ANOVA, paired t-tests, 3-way controlled Diagrams, goal plots, etc. are basic tools of this methodology.
From Santa Clara, California, Tao Yu leads global supplier engineering effort on coating and adhesive at Applied Materials. Tao holds a PhD in Polymer Materials Science. He has worked in the R&D role with various industries, where he practiced JMP learnings into product design and process optimization. Tao's recent interest in quality engineering motivated him to seek greater utilization of JMP tools and statistical guidance. Tao is STIPS certified, now working on black belt certification.
Originally from Santa Clara, California, he oversees global supplier engineering for coatings and adhesives at Applied Materials. He has a PhD in polymer materials science and has worked in research and development roles across a variety of industries, applying his knowledge of JMP to product design and process improvement. Recently, he has become interested in quality engineering and aims to make greater use of JMP's tools and statistical guidance. He has completed STIPS and is currently working on his SixSigma Black Belt certification.
