Experimental Design and Analysis (Elementary and Intermediate)
Date: April 9 - April 11, 9:30-16:30
Location: Hyatt Regency Shanghai Wujiaochang
Address: No. 88, Guoding East Road, Yangpu District, Shanghai
Duration: 3 days (6 hours*3=18 hours)
Special price: 4,800 yuan/person (register before March 16)
Standard price: 5500 yuan/person
Note: Only those who attend the conference can register for pre-conference training. The training fee includes training fee and working lunch fee. Other expenses are self-paid
Training lecturer: Xu Zhan, JMP China data analysis consultant
Lecturer Profile: Currently serving as a data analysis consultant for JMP China, Master of Industrial Engineering from Tsinghua University, familiar with Six Sigma management concepts and practices, good at applying statistical analysis methods such as exploratory data analysis, experimental design, modeling prediction, survival and reliability analysis, and statistical process control in practical work. He has accumulated valuable experience in the application of statistical techniques in high-tech, pharmaceutical, financial, automotive and other industries, and has provided professional training for more than 50 well-known companies.
Participants:
- Engineering technicians who are responsible for planning and implementing experimental design, teachers and students in engineering technology and management, and other people who are interested in or just starting out in experimental design DOE.
Course content:
- General Introduction to DOE Experimental Design
- The difference between DOE and traditional analysis methods
- DOE's core technology
- Special terms and analysis ideas in DOE
- Applied Statistical Basis for DOE Experimental Design
- hypothetical test
- variance analysis
- regression analysis
- Descriptive DOE Experimental Design
- Three basic principles of DOE
- 2 k Full Factorial Design
- Screening DOE Experimental Design
- Fractional Factorial Design
- Interpretation of the resolution table
- Plackett-Burman Design
- Optimized DOE experimental design
- Response Surface Design
- Construction of Desirability Function
- Graphical representation of polynomial models
- Model simulation and prediction
- Overview of Advanced DOE Experimental Design
- Custom Design
- Expansion Design
Experimental Design and Analysis (Advanced)
Date: April 10th - April 11th 9:30-16:30
Location: Hyatt Regency Shanghai Wujiaochang
Address: No. 88, Guoding East Road, Yangpu District, Shanghai
Duration: 2 days (6 hours*2=12 hours)
Special price: 4,800 yuan/person (register before March 16)
Standard price: 5500 yuan/person
Note: Only those who attend the conference can register for pre-conference training. The training fee includes training fee and working lunch fee. Other expenses are self-paid
Training Instructor: Zhou Wei, JMP China Consulting Manager
Lecturer Profile: Currently serving as JMP China Consulting Manager, Six Sigma Master Black Belt (MBB), and senior expert member of the Six Sigma Expert Committee of the China Quality Association; Proficient in Lean Six Sigma, quality management, industrial engineering, experimental design DOE, etc., and provides professional training for more than 200 well-known companies.
Participants:
- Engineering technicians and teachers and students of engineering technology and management who are responsible for planning and implementing experimental design and have participated in DOE basic training, or other people who already have rich experience in DOE.
Course content:
- A Quick Review of Classical Experimental Design (DOE)
- Special terms and analysis ideas in DOE
- Advantages and Disadvantages of Traditional DOE
- An overall introduction to the DOE family
- Custom Design
- Criteria for judging experimental plans
- Standardized steps for experimental design
- Improvements to existing experimental designs
- Classroom Exercises and Sharing (I)
- Determination of sample size
- Minimum sample size for continuous experimental results
- Minimum sample size for discrete experimental results
- Sample size issues in reliability experiments
- Other types of DOEs
- Mixture Design
- Taguchi Design
- Nonlinear Design
- Space filling design
- Select Design
- Definitive Screening Design
- Classroom Exercises and Sharing (II)
Reliability Analysis
Date: April 9 - April 11, 9:30-16:30
Location: Hyatt Regency Shanghai Wujiaochang
Address: No. 88, Guoding East Road, Yangpu District, Shanghai
Duration: 3 days (6 hours*3=18 hours)
Special price: 4,800 yuan/person (register before March 16)
Standard price: 5500 yuan/person
Note: Only those who attend the conference can register for pre-conference training. The training fee includes training fee and working lunch fee. Other expenses are self-paid
Training lecturer: Chen Jiasong, Senior Consultant of JMP China
Lecturer Profile: Currently a senior consultant in JMP China, quality management analyst, Six Sigma Black Belt, ISO9001 quality system chief auditor, mastering the concept and practice of Lean Six Sigma management, and good at the application of statistical analysis methods such as exploratory data analysis, experimental design, modeling prediction, survival and reliability analysis, statistical process control, market research, etc. in actual business. Focusing on the deep integration of modern analysis tools and business processes, forming a standardized customized analysis platform through secondary development of software, comprehensively helping users to improve their data analysis capabilities, and accumulating valuable experience in the application of statistical analysis technology in semiconductor, electronics, medicine, chemical, education and other industries
Participants:
- Engineering technicians who are responsible for planning and implementing product reliability testing and analysis, teachers and students in engineering technology and management colleges, and other people who are interested in reliability analysis.
Course content:
Lifespan data analysis
- Life Data and Censorship Types
- Nonparametric distribution models and estimation
- Parametric models and maximum likelihood estimation of parameters; selection and use of parametric models
- Analysis of competition failure mechanism; establishment and use of models
Common truncated life test design
- Test purposes
- Determination of sample size
- Determination of test length
Analysis of Accelerated Life Test Data
- Experimental purpose and data types
- Analysis of single accelerated stress accelerated life test data; test assumptions and verification; model selection and use
- Analysis of multi-accelerated stress life test data; establishment, selection, and use of parameter models
Design of Accelerated Life Test
- Design of Single Accelerated Stress Accelerated Life Test
Forecast of warranty reserves
- Purpose of warranty reserve forecast and type of field data
- Modeling and selection of quality assurance field data
- Types, calculation, evaluation and selection of confidence intervals for warranty reserve forecasts
Reliability growth tests and analysis of field data
- Purpose and Type of Data for Reliability Growth Tests
- Types of reliability growth parameter models, parameter estimation, model selection and use
- Reliability Growth Field Incomplete Data, Models, Parameter Estimation and Model Use
Reliability Block Diagram
- Purpose of using reliability block diagram
- Components of a Reliability Block Diagram
- Component types and settings of reliability block diagram
- Output data and application of reliability block diagram
