How to get process parameter yield by wafer in a lot?

Neo

 I want to get process parameter yield per "Wafer ID in lot ID" from the sample data table "Semiconductor Capability.jmp". 

However, I am not able to proceed as I am getting an error: "Process Screening requires at least 7 rows of data."

 

Names Default To Here (1);
clear log ();
dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");

col_names = dt << Get Column Group("Processes"); 
ps = dt << Process Screening (Process Variables( Eval( col_names )),  
                  Spec Limits Dialog( "No (skip columns with no spec limits)" ), 
                  Control Chart Type ("Indiv and MR"),
                  By( :wafer );// Just to demonstrate	
                  //By (:"Wafer ID in lot ID");I need this but this throws error in JMP 16.2.0 (Error: Process Screening requires at least 7 rows of data.). Why?
                  );

 

Where am I going wrong?

 

Once the above script works for By: Wafer ID in lot ID, I would like to get a data table (Summary?) in the form

Column1: Wafer ID in lot ID

Column2: Process names

Column3:

Process parameter yield = 100* # passing sites (per parameter which the above script gives, I think (5 - "out of spec count"))/ # sites measured per "Wafer ID in Lot ID"

(5 sites measured per wafer in this example data case)

How to do this via JSL?

jthi

Have you tried using Group instead of By for could grouping column?