A detailed visualization of air gap measurements between stacked glass substrates was created using JMP software. This visualization was generated through a meticulous measurement process using low coherence interferometry, which accurately measures the gaps without contacting the substrates. By plotting these measurements on an XY plot (with quantile grouping), JMP provides a clear spatial representation of air gap variations across the substrates' surface.
The surface plot generated in JMP further enhances understanding by showing a topographical view of the substrate surface. This visualization is crucial as it highlights a significant bow at the center of the stack, a defect that leads to stress upon adhesion and subsequent delamination further along the production line.
Utilizing JMP's analytical tools, we conducted a root cause analysis. The visual output from the software pinpointed the central bow, enabling prompt corrective actions. This process showcases the power of JMP in transforming complex data into actionable insights, ensuring the manufacturing integrity of the stacked glass substrates. This presentation also demonstrates how JMP's new workflow add-in enables nonscript-oriented users to showcase data independant of any scripting knowledge.
