There are numerous parameters in semiconductor equipment, and countless amounts of data are generated every second. In order to analyze such a large amount of data, complex preprocessing processes, statistical approaches, and analysis tools that can visualize it are required.
Using JSL, you can automatically statistically analyze all data in batches and show the analysis results through a One Page Summary Report. We introduce an example of how engineers developed a JMP Add-in to enable anyone to easily perform complex analysis.
