To manufacture a single semiconductor, numerous unit processes are required.
Quality semiconductors can be obtained only when each process proceeds well, and this is managed through measurement between processes. However, consistent analysis is difficult because it exists in various forms by equipment and FAB.
Here, we introduce a case where anyone can easily, quickly, and consistently analyze using JSL.
It predicts the distribution of RESPONSE within WAFER with limited data and provides statistical information.
Additionally, it displays interactive analysis results visually.
