What inspired this Wish List Request?
The goal is to define some area of search for peaks finding in FDE platform.
If you want to find which batchs has some specific material, you have to search peaks at different specific location in your spectrum.
So the request is to be able to define several X ranges for peaks finding.
Please describe the new or improved feature or solution you would like to see.
The first idea would be to filter the X axis. But in the FDE platform, it will not be possible. the only possibility is to keep a range of X.
So the user has to filter previously the data and it adds complex steps.
Another idea would be to have some option in the automatic peak detection algorithm, to specify several locations.
What would the value be to you and/or other users if this new feature is provided?
Easier and time saving.
Be able to focus on analysis and not on data preparation.
Is this an external customer request?
ST Microelectronics at Grenoble, package assembly team.
Is there a competitive software package that has this feature or solution that we should be aware of?
No idea
Will this impact a renewal, expansion, or adoption at a customer, and does this put an account at risk if we do not address this?
it will help the adoption of JMP Pro by ST Micro
