Following is an example similar to my actual data case. I am interested in looking at the correlation between two process variables known to be dependent on each other. Especially, I would like to understand the wafer number dependence of the correlation.
For my actual data case, unlike the example case here, the x-axis variable is bi-modal on the wafer number (first say n wafers sit on one mode, the rest on the other mode).
How to best analyse the data to understand if there is a statistically significant correlation on a wafer number basis between the two variables?
Names Default To Here(1);
clear log ();
dt = Open("$SAMPLE_DATA/Semiconductor Capability.jmp");
Bivariate( Y( :PNP1 ), X( :PNP2), Fit Line( {Line Color( {212, 73, 88} )} ) );I admit that the way I have approached this may not be the best way to look at this problem, so alternate routes are welcome, but I would like to keep the analysis simple for a start and keep deep statistics away unless unavoidable .