Hi team,
I have a customer asking if it is possible to build a predictive model to predict defects on the edge of wafers, when the wafer data is in text form? The goal is to use this model to optimize the parameter settings to minimize these edge defects.
I was wondering if anyone have come across this before as I imagine it could be a common problem. I've attached an example of the text data wafer map here.
Any help or advice would be appreciated! Thank you in advance
