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How Can I use JMP for Statistical Process Control (SPC) for Semiconductors?

 

JMP is useful for SPC in all industries, including this example for semiconductors. 

 

See how to:

• Understand process shifts and add alarms
• Screening multiple parameters for stability (Process Screening)
• Filter to find important factors (Predictor Screening) and determine their capability
• Monitor multiple parameters in one control chart through Model Driven Multivariate Control Chart to ID the underlying components that lead to out-of-control signals

Quality and Process Engineering