Hi,
I have a semi customer doing simulation experiments. They build modules from several components (using SAW and TC-SAW). The customer is asking for a module with a specific specification property. They now try to combine up to 20 components each with a spec limit range and try to find the best optimal combination of components and spec limits to stay in the module's specs. As they also vary filter types used to filter the signals from the components they currently have easy a large 3- low 4 digit number of test cases.One module test last about half a day. Reducing the number of tests can be therefore quite critical.
I thought if we could use covering arrays to reduce number of test cases.Is that correct? Or is there also another option? Using categorical design won't reduce the number of test cases.