Hello,
I work in the semiconductor industry. Let's say I have a wafer. This wafer has dies spread around the wafer, as shown. Within each die there are rows / columns each representing gradients of some metric at a specified point. From left to right, for instance, metric A starts at a max value and dwindles to the min on the right. From top to bottom, metric B follows the same pattern.
I've set up a wafer map shape where each shape number is the die. However, the values for any colored metric is averaged within the die because of the map shape. Is there a way to change this averaging behavior into a contour map, within each die? If I click on the contour option in the Graph Builder, the visualization goes blank.

I've been searching for this, but I haven't found answers.
Thank you in advance!