Hi!
I am running an experiment using several sensors out of a laboratory experiment where I've been able to collect about 700 samples , each with about 200 points of functional data, I've been using Functional Data Explorer for dimensional reduction through fitting of a Fourier basis and then its corresponding FPCs.
I am following the example " Fermentation Process" example found in documentation (page 299 of JMP 16.2 manual), I will later run a classifier to identify class 0 or 1, which is already labeled in the same data. All good so far, but how can I test this classifier against unseen data? how can I obtain the corresponding FPCs out of new data using the original fourier fit??
Many thanks!!
Rual
