Prediction and analysis of RESPONSE by WAFER using JSL (2021-KR-30MP-1023)JIYUN KANG, SK Hynix
Numerous unit processes are required to make a single semiconductor.
Each process must proceed well to obtain high-quality semiconductors, which is managed through measurement between processes. However, consistent analysis is difficult because it exists in various forms by equipment and FAB.
Here, we introduce a case where anyone can easily and quickly perform consistent analysis using JSL.
It predicts the RESPONSE distribution within the WAFER with limited data and provides statistical information.
In addition, interactive analysis results are visually displayed.
BreakoutData VisualizationJSL Application Development
