Vasco Cachaco, Business Improvement and Analytics Engineer, Xaar plc
Measurement System Analysis is a methodical approach to identifying and managing the sources of variation that can influence the measurement system. At the top level, this type of analysis enables the quantification of the measurement system variation (MV) present in the Total Observed Variation (TV) of a process or system. It separates it from the Process (part-to-part) Variation (PV). The measurement variation can be broken down further into Precision and Accuracy. For the Precision component, we follow a sequential method for Continuous Data to determine the adequacy of a measurement system. A Type 1 Gauge Study examines the accuracy and consistency of the measurement device, and a Full Gauge R&R Study explores the Repeatability and Reproducibility of the entire measurement system. This poster will demonstrate the practical application of these tools in JMP 17.
