Level: Beginner
【Presenter】
SAS Institute Japan K.K. JMP Japan Division
Technical Group System Engineer Yuichi Katsumura
[Presentation overview]
In the manufacturing industry, measurements are performed in various situations such as process control. For example, if the measurement is not performed accurately, it becomes difficult to understand whether the variability in the measured value is due to the measurement system or the process. So how can you find out the measurement accuracy of your measurement system? This is where measurement system analysis (MSA) comes to the rescue. Measurement system analysis includes evaluation of bias, stability, and linearity, but in this presentation, we will mainly introduce Gauge R&R analysis and EMP analysis, which analyze the variation of measurement systems. With JMP, you can design measurement systems analysis experiments and output analysis results. We will also be highlighting some of the new features and changes related to measurement system analysis that have been added in JMP 17.
[Presenter profile] Joined SAS Institute Japan Co., Ltd. in 2010. Currently, I am mainly in charge of customers in the chemical industry, and I am in charge of pre-sales work for JMP products, such as JMP seminars and JMP demonstrations.
