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最近鄰晶圓圖

你好
是否可以過濾特定缺陷（在缺陷列中）和 8 個最近鄰居並從主表中提取數據子集？

謝謝

高級統計建模內容組織數據混合和清理數據探索和可視化大規模定制回复：最近鄰居晶圓圖非常感謝回复：最近鄰居晶圓圖

以下示例使用 JMP 示例表中的晶圓堆疊數據表來選擇最近的相鄰芯片

names default to here(1);
dtMain =
// Open Data Table: Wafer Stacked.jmp
// → Data Table( "Wafer Stacked" )
Open( "$SAMPLE_DATA/Wafer Stacked.jmp" );
dtMain << set name("Main");
dtMain:X_Die << modeling type(Ordinal);
dtMain:Y_Die << modeling type(Ordinal);

// For illustration, use only Wafer 1 data
dtMain << select where( :Wafer == 1 & :Lot =="1" );
dtMain << invert row selection;
dtMain << delete rows;

// Create a separate data table that only has the die with defects in them
dtMain << select where( :Defects > 0 );
dtDefects = dtMain << subset( selected rows( 1 ), selected columns( 0 ),
output table( "Defects" ) );

// Remove the defects column from the main table
dtMain << delete columns( :Defects );

// Create a table with the nearest neighbor data from the main table, based upon one of the 
// defect die that has a defect in the defect table.
// For illustration we will pick the die in the Defect table in row
DefectRow = 1;

dtMain << select where( dtMain:X_Die >= dtDefects:X_Die[DefectRow] - 1 & 
dtMain:X_Die <= dtDefects:X_Die[DefectRow] + 1
 &
dtMain:Y_Die >= dtDefects:Y_Die[DefectRow] - 1 & dtMain:Y_Die <= dtDefects:Y_Die[DefectRow] + 1 
);

dtNear = dtMain << subset( selected rows( 1 ), selected columns( 0 ),
output table( "Nearest" ) );

// Display the selected die
dtNear << Graph Builder(
 Size( 512, 448 ),
 Show Control Panel( 0 ),
 Variables( X( :X_Die ), Y( :Y_Die ) ),
 Elements( Points( X, Y, Legend( 5 ) ) )
);

 

回复：最近鄰居晶圓圖

我建議檢查一下半導體工具包加入。 層次聚類也可能有效。 也總是可以選擇執行一些基本上可以執行“任何操作”的腳本（KDTable() 可能是一個好的開始，近鄰均值計算）。