Hi
Is this possible to filter a specific defect (in defect column) and 8 nearest neighbor and subset the data from main table?
Thanks
Here is an example using the Wafer Stacked data table from the JMP Sample tables that selects the nearest neighbor die
names default to here(1);
dtMain =
// Open Data Table: Wafer Stacked.jmp
// → Data Table( "Wafer Stacked" )
Open( "$SAMPLE_DATA/Wafer Stacked.jmp" );
dtMain << set name("Main");
dtMain:X_Die << modeling type(Ordinal);
dtMain:Y_Die << modeling type(Ordinal);
// For illustration, use only Wafer 1 data
dtMain << select where( :Wafer == 1 & :Lot =="1" );
dtMain << invert row selection;
dtMain << delete rows;
// Create a separate data table that only has the die with defects in them
dtMain << select where( :Defects > 0 );
dtDefects = dtMain << subset( selected rows( 1 ), selected columns( 0 ),
output table( "Defects" ) );
// Remove the defects column from the main table
dtMain << delete columns( :Defects );
// Create a table with the nearest neighbor data from the main table, based upon one of the
// defect die that has a defect in the defect table.
// For illustration we will pick the die in the Defect table in row
DefectRow = 1;
dtMain << select where( dtMain:X_Die >= dtDefects:X_Die[DefectRow] - 1 &
dtMain:X_Die <= dtDefects:X_Die[DefectRow] + 1
&
dtMain:Y_Die >= dtDefects:Y_Die[DefectRow] - 1 & dtMain:Y_Die <= dtDefects:Y_Die[DefectRow] + 1
);
dtNear = dtMain << subset( selected rows( 1 ), selected columns( 0 ),
output table( "Nearest" ) );
// Display the selected die
dtNear << Graph Builder(
Size( 512, 448 ),
Show Control Panel( 0 ),
Variables( X( :X_Die ), Y( :Y_Die ) ),
Elements( Points( X, Y, Legend( 5 ) ) )
);
I suggest checking out Semiconductor Toolkit addin. Hierarchical clustering might also work. There is also always option to do some scripting which can do basically "anything" (KDTable() might be a good start,Near neighbors mean calculation).
