(18Aug2019) - A note from the author
Hi, All! It's time to start thinking about a new version of the STK... I've got some things that I'd like to do, but I also want to hear from those using the tool. If there's something you don't see or think could be improved - drop me a private message. I do plan to look through the comments section as a sanity check, but I may miss something. So, if it's important, do send me a private message.
THE SEMICONDUCTOR TOOLKIT (VERSION 2)
The Semiconductor Toolkit is an attempt to answer the need from the semiconductor industry for specialized visualizations and reframing of existing JMP capabilities. On its initial release, the toolkit contained tools for generating patterned and unpatterned wafer maps, annotating existing graphics with wafer geometry, and a semiconductor specific frontend to the Hierarchical Clustering with spatial measures option. It has now been expanded to include analytical methods for exploring die defect data, making comparisons between wafers, and a collection of tools and utilities contributed by the user community. The toolkit is intended to be a collaborative and living effort by interested parties. Constructive criticism, bug reports, and capability suggestions are welcome and encouraged.
