Hello,
good
morning.
Good
evening everyone.
My name
is Raisa.
I'm
a
manufacturing
quality
engineer
of
Applied
Materials,
Taiwan.
I
started
to
learn
JMP
at
beginning
of
this
year.
Recently,
I
pass
ed
this
certification
exam
with
score,
925
in
this
July.
Today,
I'd
like
to
make
a
short
presentation
about
QN Immediate Fix
Time Analysis
by
JMP.
As
we
know,
once
a
quality
notification
cure
is
created,
it
must
take
additional,
more
or
less
time
to
fix
issue,
and
may
impact
on
production
planning
and
scheduling.
Therefore,
we'd
like
to
find
a
worst-
case
by
analysis.
Okay.
For
analysis,
here
are
five
s
ub topics
on
agenda.
First,
the
Root
Cause
Analysis
of
QN
Fix Cycle
Time,
Graphical
Root
Cause Analysis Summary,
Compare Fit Model,
Partition,
Neural Model,
and
then H
ybrid
Text M
ining
and
the
Data
Mining
Analysis.
Finally,
Take
Away
Learnings.
Okay,
let's
get
started.
The Histogram.
1st
layer
of
Root Cause
Analysis
of
QN
Fix
Cycle
Time.
Before
investigation,
think
about
that.
What scenarios
impact
on
QN Fix
Cycle T
ime
and
how
long
is
it endurable?
First up,
define
five
days
as
a
criteria
and
also
a
key
condition
to
follow C-wide
spread
i
n wording
and
within
five
days,
we
in spec
and
success
criteria.
On
the
other
hand,
over
five
days
out
of
spec
failure
analysis,
later,
I
make
directly
a
breakdown
to
SA
and
the FA.
Notice
this
shade
of
distribution
between
SA
and
the
FA.
Meanwhile,
look
at
the
Mosaic
Plot
for
the
proportion
of
each
category
to
infer
a
potential r
oot cause
for
the
success
analysis.
We
can
see
the
Workmanship
and
MFG rework,
seem
to
have
quick
response
and
better
fix
cycle
time.
For
FA
dimension
issue,
take
more
fix
cycle
time.
It
is
obvious
variation
in
FA time.
Distribution
between
SA
and
the
FA,
suppose
if FA time
is
one
of
the
key
factor,
S1 to
impact
the f
ix c
ycle
time.
The
Box P
lot.
The box plot is
a
graph
of
the
distribution
of
continuous
variable.
Therefore,
plot
continues
fixed
cycle
time
versus nested
structure,
categorical
country
under
containment
to
search
other
factors
impact
fix
cycle
time
or
not.
It
displays
the
five-
number
summary
of
setup
data.
It
is
non-
parametric
tool
to
use
Median
as
central
tendency.
Besides,
there
are
some
observations
on
box plot
graph.
First, at
least
seven
point
to
detect
the
first outlier.
Otherwise,
it
becomes
whisker (skew)
group
problem
where
sample
size
is
less
than
seven
.
Second,
observed
screwed
distribution
by
Box Width
or
Whisker Length.
How
to
handle
marginal
outliers,
which
are
we
think
two Sigma
GRR noise
from
whisker
and
back
to
the
Root Cause Analysis,
it
is
not
difficult
to
find
a
recycle
time
of
the
containment
replacement
is
much
longer
than
other
containment.
And
with
that,
Xâ containment
and
Xâ
country
here.
Heatmap.
Heatmap
is
another
graphical
tool
to defect
data
value
by
color.
A
gain, until now,
we
gather
three
input
factors,
defect type from
histogram,
containment
and
country
from
box plot
and
in
order
to
follow
study quarter
impact
quarter input
impact
on
fixed
cycle
time.
Here
at
back
categorical
called defect type
on
Y axis
and
the
color
cycle
time
and
keep
bus
prognostic
structure.
Categorical
country
under
containment
in
X
and
X
group.
Then
use
a 8
by
9
layout
look
balance
to
quickly
catch
out
the
maximum
and
the
minimal
cycle time
scenarios.
For
FA,
it
is
easy
to
find
a
little
red
area,
right?
The
library
highlights
the
longest
fix
cycle
time.
With that, Replacement
Taiwan
Damage
parts,
in
the
worst
case
for
cycle
time.
The
Replacement
United
States
and
the
Dimension
issue
parts
is
the
second
worst
scenario.
For
SA
is
set
for
dimension
and
damage defect.
Others
are
easy
to
quickly
fix.
For
Pareto C
hart,
to
further
analyze
the
FA
and
SA
from
heatmap
,
heatmap must
use
two-
dimensional
Pareto
Chart
by
to
variable
defect type
and
the
country
under
specific
containment.
Here
are
Xâ
defect type,
Xâ
containment
and
Xâ
country
we
mentioned
before.
Then
add
additional
workstation
Xâ
here
in
the
course of
Pareto C
hart
to
visualize
frequency
event.
Now
for
FA failure
analysis,
we
get
replacing
high
work supplier
damage
issue,
frequently
happen
in
CVD
service
fraud
or
replacing
United
States
supplier
dimension
issue
often
happens
in
CVD
workstation.
In
the
same
way
for
X
analysis,
instead for
dimension
issue
or
damaged defect,
United
prior,
functional
and
a
workmanship
issue
can
quickly
fix
in
CVD
major
test.
Currently,
we
have
four
input
factors
and
SA
and FA
frequency.
For
interface,
one we
are
more
interest in
is
pass
or
fail
frequency
or
pure
cycle
time.
Then
Tabulate.
Here
put
our
previous
mention
of
factors
Xâ to Xâ
for
on
Tabulate.
Meanwhile,
Tabulate
pure
cycle
time
and
frequency
into
a
account
to
do
further
comparison.
For
FA, CVD
service
fraud,
damage
issue,
Taiwan
supplier
require
replacement,
it did take a
longer
cycle time
although
the
frequency
is
now
the
highest,
like
seven
times
here,
the
means
of
the
cycle
time,
34
days is
much
longer
than
others.
For
SA,
in
CVD motor
test,
we
can
measure
issue
in
United
States
prior
and
fixed
by
MFG re
work.
Even
there
is
only
one
day
on
the
table,
but
the
frequency
and
is
far
too
low
to
be
true.
Here
I
summarize
the
main points.
Follow
Root Cause Analysis,
use
different
graphical
JMP
platforms
in
engineering
and
large
caustics
sequence
to
conductive
prior
Root Cause Analysis.
In
previous
slide,
I
show
Histogram,
Box plot,
Heatmap, Pareto
Chart
and
the
Tabulate.
Second,
identify
a
potential
input X
to
protect the
QN
fixed
cycle
time.
A
ccording
to
the
Tabulate,
the
FA results
from
a
damage
issue,
replacement,
Taiwan
suppliers
and
CVD
service
workstation.
Next,
build
a
model
to
predict
QN
fix
cycle
time
and
validation
of
the
root
cause.
Before
entering
each
model's
detail,
here,
I'd
like
to
introduce
model
selection
and
the
comparison first up.
The
fit
model,
consider
data
structure
and
a
distribution.
Here
are
some
challenge
in
fit
model.
For
skewed
distribution,
use
log
transformation,
but
no
help.
All input
variable,
Xâ to Xâ are
categorical
type.
After
I
build
our
60
%
of
workstation
category,
R-square increased
6
%
only.
Check
dependency
among
a
categorical
variable
by correspondence
analysis part.
It
is
low
risk
because
the
closer
things
are
to
a
region,
the
less
distinct
that
they
probably
are.
In
other
word,
the
farther
away
the
more
distinct.
Second,
proximity
between
labels
probably
indicate
a
similarity.
For
partition
tree
model,
the
plus
points
are
distribution
free
model,
split
based
on
data
available,
little
overfit concern,
but
minus
points
recursive
split.
Therefore,
use JMP
projector
screen
by
random
forest
to
average
a
recursive
product
and
find
out
a
five
input
factor
with
their
ranking.
It
is
convenient
and
a
quickly
way
to
find
important
input
to
optimize
or
improve
model.
Regarding
a
neural
network,
the
plus
points
are
strong
transformation
model,
two
steps
training
and
a
validation
model.
However,
the
minus
is
significant
overfit concern
.
Which
model
is
more
proper
to
be
believed
that
goes
through
each
model
results?
Come
back
to fit
model,
main
event
only.
If
our
score
isn't
high,
only
30
%
are wrong,
because
data
is
severe
right skewness.
Observed significant
level
of
risk,
so
Max
R-
square
around
just
47
%
is
not
worth it
and
use
log
transformation
of
the
cycle
time
variable
to
avoid
a
negative
number
of
95
%
confidence
interval,
but
no
help a
lot
so log
choice
is
out.
The
next
is
Partition
Tree
Model.
Here
are
three
partition
models,
are
baseline
model,
model augmentation
and
a
model
simplification.
Experience
a
series
of
improvement
per
engineering
and
the
logical
thinking
that R
square
improved
to
62
%
from
38%
baseline
model.
All the
detail
will
show
you
step
by
step
in
following
slide.
Model
augment.
During
this
step,
we
improve
model
20
%.
Where
are
they
from?
First,
they
will
present
improve.
Here,
changing
QN age
to
immediate fix
cycle
time
for propriety
experience,
but
no
help.
Second,
6%
and
add
one
X
factor
workstation.
Remember
it
is
export,
we
discover
from
Pareto C
hart.
UD code
becomes
less
critical
from
26
% to
8
%
only.
The
third and ano
ther
4
%
by
changing
to
containment
from
UD
code.
Now,
check
a
contribution
ranking
here.
The
number
two
become
workstation
instead
of
country
anymore.
In model
simplification,
here,
improve
additional
6
%
R
square
by
model
simplification.
Before
simplification
model,
the
plus
is
all
scenario
under
consideration,
but
like
minus
two,
many
categories
might
dilute
predict
power.
In
simplification
model,
filtering
out
minor
categories
with
fewer
counts,
like
remove
60
%
categories
of
workstation,
the
total
amount
decreased
to
270
from
426.
Check
again,
the
contribution
ranking,
the
defect
type
and
our
workstation
are
still
the
number
one
and
the
number
two.
Now,
we
have
more
confidence
to
use
the
model
to
predict
the
FA
and the SA.
For
Partition
Tree
Model Optimization
as
I
mentioned
before,
the
major
contributors
are
Defect type
&
Workstation
around
80% for Pareto C
oncept.
Compare
defect type
in SA
and FA
prediction.
For
SA
here,
it's
labeling
issue.
Makes
sense,
we
don't
spend
more
time
to
fix
every
issue.
For
FA,
it's
damage.
Yes,
it
would
take
much
more
cycle
time.
About
a
workstation
comparison
between
SA
and
FA
PVD
mechanical
and
CVD
module
tester.
Currently,
it
still
needs
further
analysis
and
understanding.
About
the FA
country
here,
in
a
profile
or
prediction
profile
is
flat.
Doesn'
t
country
impact
QN fixed
cycle
time?
Is
it right?
To
answer
the
question
here,
I
introduce
the
model
limitation,
recursive
partition.
Recursive
partitions,
sequential
dependency
risk.
Factor
country
is
spread
six
times,
and
only
one
time
happen
in
higher
cycle
time
cluster.
Such
recursive
dependency
limitation
may
impact the
predictive
model.
The
third model,
Neural
Network
(Artificial Intelligence).
Here
observes
severe
overfit
concern
between
training
and
the
variation
R square.
If
R-square
between
Training
Set
and
V
alidation
Set
is
over
20
%,
it
has
overfit
concern.
Besides,
we
find
it in
neural
model,
the
number
one
ranking
is
workstation,
and
the
number
two
is
fault
by
which
is
different
from
previous
partition
model.
For
SA,
the
workstation
is
at
staging,
CCT staging,
where
material
are
brought
together
before
entering
MFG fault
,
and
it
doesn't
have
competitive
operation
process.
Once
the
issue
happen,
it
can
be
fixed
quickly.
Makes
sense.
For
FA
at
the
CVD service fraud,
it
has competitive
operation
process.
Yes,
it
did
to
have
longer
cycle
time
to
treat
difficult
issue.
Until
now,
we
already
have
three
model,
Tree
Model
Partition
and
the
Neural
Model,
and
which
model
is
much
more
proper
and
meet
reality.
Therefore,
model
comparison
and
selection,
Root Cause Analysis,
graphical
tool
damage
issue
replacement,
Taiwan
CVD
service fraud
is
the
worst
scenario
with
longer
fixed
cycle
time.
Currently,
Neural
model
has
the
identical
scenario
as
the
Graphical
Root Cause Analysis,
but
only concern is overfit
risk.
Besides,
the
three
model
has
very
close
prediction
on
the worst
cycle
time
within
1.2
days.
The
final I will
introduce,
Test
Mining
and
the
Data
Mining
Hybrid.
Currently
in
QN D
ata
base,
it
still
has
test
messenger
resulting
well
to
such
more
information
about
long
cycle
time
in QN
tester
variable
database.
Use
JMP Test Explorer
to
discover
some
frequency
keywords
such
as
here,
I
circle
replace,
rework,
dimension
and
the
F10246
a project
to
do
further
analysis,
then
convert
them
to
binary
detectors,
conduct
a
further
Data
Mining
and
the
Root Cause Analysis
on F10246 case via
heatmap
graph.
Here,
put
dimension
indicator
under
F10246
and
containment
replace
and
re
work in
Y.
According
to
the
heat
map
results,
F10246
it did
suffer
lots
of
fix
cycle
time
that
other
project
by
color
results
and
check
dimension
detector
observed
is
not
only
dimension
issue,
but
also
our
various
defect cause
long
cycle
time,
even
if
just
are
fixed
by
rework.
In
the
end,
here
are
my takeaway learning.
JMP G
raphical
Platforms
are
very
powerful
to
conduct
deeper
r
oot cause analysis
through
engineering
and
the
logical,
data-
driven
process
and
compare
and
select
a
more
appropriate
JMP
model
from
Classic
Fit M
odel,
P
artition
and
a
Neural
Network
by
knowing
the
model
limitation
and
the
risk
of
connecting
to
previous
Graphical
Root Cause Analysis.
Conduct
a
Hybrid
Text M
ining
and Data Mining R
oot
Cause
Analysis
on
the
complicated QN Database.
Final,
I'd
like
to
thank
GCI
M
BB
Charles Chen
as
my
project
mentor
and
that's
all
my
presentation.
Thank
you
for
your
time
and
attention.
Thank
you.