Laura Lancaster, JMP Principal Research Statistician Developer, SAS
Annie Zangi, Sr. Research Statistician Developer, JMP
The quality and SPC platforms in JMP 17 have many new features and capabilities that make quality analysis easier and more effective than ever. The measurement systems analysis platforms—Evaluating the Measurement Process (EMP) MSA and Variability Chart—have been reorganized and improved and a new Type 1 Gauge Analysis platform has been added. The Manage Limits utility (previously called Manage Spec Limits) has been generalized and expanded to handle many types of quality related limits that are needed to work easily with many processes in various quality platforms. The Distribution platform has added the ability to adjust for limits of detection when fitting distributions and performing process capability analysis. Control Chart Builder has several new features including a label role, a row legend, a new button to switch an XBar/R chart to an IMR chart, new dialog options and Connect Thru Missing. Both the EWMA and the Cusum Control Charts have several new features including the abilities to save and read from a limits file and save additional information to the summary table.
