Expert insights from Professor William Q. Meeker, part 4
In the final post of this series, we see the last bits of JMP Chief Data Scientist
Chris Gotwalt
’s
interview with world-renowned reliability expert,
William Q. Meeker
, Professor of Statistics and Distinguished Professor of Liberal Arts at Iowa State University. The
first post
touched on “proactive reliability” and how machine learning, IoT, and Industry 4.0 have implications for maintenance and improved reliability. The
second post
explored overlapping disciplines and foundational contributions of statistics, as well as the evolution of statistics education. The
third post
examined the growing importance of Bayesian methods.
The interview complemented the plenary talk Bill recorded for the 2021 Discovery Summit Japan. This blog series features sections of Chris’ interview to shine light on Bill’s many contributions to statistics, as well as two recent books he has co-authored:
Achieving Product Reliability: A Key to Business Success
, with Necip Doganaksoy and Gerald J. Hahn; and the second edition of
Statistical Methods for Reliability Data
,
which Bill co-authored with Luis A. Escobar and Francis G. Pascual
.
We are pleased to offer the
first chapter
of
Achieving Product Reliability
.
We have had a long and fruitful collaboration with Bill, adding new methods for reliability analysis into JMP software. We are grateful for his many contributions to statistics and working with us to incorporate new and better methods to enable better product reliability.
In the first clip, Bill reveals his motivation for writing the book on statistical intervals.
Here, Bill shares an interesting exchange he had with W. Edwards Deming.
You can see the entire interview, as well as Bill’s plenary talk at Discovery Summit Japan from November 2021,
here
in the JMP Community.
Reliability expert William Q. Meeker, Professor of Statistics and Distinguished Professor of Liberal Arts at Iowa State University, chats with Chris Gotwalt about his motivation to write this book.Reliability expert William Q. Meeker, Professor of Statistics and Distinguished Professor of Liberal Arts at Iowa State University, chats with Chris Gotwalt about his motivation to write this book.
Meeker talks about writing a book on statistical intervals and an exchange he had with W. Edwards Deming.
Predictive Modeling and Machine LearningRe: Expert insights from Professor William Q. Meeker, part 4Thanks, Deepak and Gail, for sharing these links. Bill's contributions have indeed been leveraged far and wide for the benefit of many.
Re: Expert insights from Professor William Q. Meeker, part 4I recall the SAS Warranty Solution leveraged a lot of the findings from the Wu-Meeker paper. Early Detection of Reliability Problems Using Information From Warranty Databases
Re: Expert insights from Professor William Q. Meeker, part 4Bill describes advantage of Bayesian statistics, Bayes methods, including when using non-informative priors with small amount of info., as one often does when evaluating reliability. His interesting example was and included in the first edition of his Reliability book. His recent 2021 Edition 2 of Statistical Methods for Reliability Data, includes more Bayesian examples.
