LIVE WEBINAR
Explore Your Data with Wafer Maps & Dynamic Visualization
Date: Tuesday, May 10
Time: 12:00 - 1:00 p.m. ET (10:00 - 11:00 a.m. MT)
Location: Online (Zoom)
Registration: Free
JMP software helps some of the world's largest and most innovative semiconductor companies succeed in a highly competitive market.
The semiconductor webinar series will show you how to accelerate your development timelines, more predictably and at a lower cost — all without having to write a line of code.
In this session, you'll learn how to:
- Use Graph Builder for wafer maps and graphical summaries of data.
- Distribution for analyzing one variable at a time.
- Fit Y by X to compare two variables.
- Partition + Fit Model: explore the relationship between multiple variables.
Who should attend:
Process Engineers, Yield Enhancement Engineers, R&D Engineers, Engineering Managers, Data Scientists, Quality Engineers, Test Engineers, Test technicians, Metrologists, and Manufacturing Engineers in the Semiconductor industry.
https://www.jmp.com/en_us/events/live-webinars/industries/semiconductor/explore-your-data-with-wafer-maps-and-dynamic-visualization.html
