Combine EMP and Gauge R&R capabilitiesOne of our Premier accounts Seagate has been requesting this for years. We have worked with them on a dashboard workaround, but they really want this embedded into the product. A lot of other customers (Gore and Corning) have informed us they like aspects of both MSA techniques. Customers like having the Effective Resolution and shift detection profiler offered in EMP along with the P/T ratio and misclassification probabilities found in Gauge R&R. Having this combined feature would give us an advantage over Minitab in the quality world, which is often the area where Minitab competes well with JMP.
Here is the link to the customer wish list request with a few more details:
Combine EMP and Gauge R&R capabilities
Statistics and AnalyticsRe: Combine EMP and Gauge R&R capabilitiesFrom a teaching perspective, sending users to two platforms to achieve what they need for MSA is confusing at best. We teach them to always do both analyses since they can't get all the answers they need from one. It is challenging when doing variance components in both, since sometimes Variability Chart switches the method of calculating them. So to get the same variance components, you have to tell Variability to use REML in the analysis settings before clicking OK.
We also need a method of designing an MSA with the appropriate randomization. The DOE platform fully randomizes, and an MSA needs a nested or more controlled randomization method. We provide a script and an addin to do this but it should be built in.
Re: Combine EMP and Gauge R&R capabilitiesWe have got the same request from Gore Japan. They said they took a look JMP 17, but ideally, they want a combined platform.
