Level: Beginner, Intermediate
【Presenter】
William Q. Meeker, Department of Statistics, Iowa State University
[Announcement summary]
When you buy a car, smartphone, dishwasher, etc., what do you look for in that product? Many people want to be able to use it for a long time without any problems, that is, to have high reliability. The difficulty with reliability assessments for manufacturers is the limited time available to prove long-term reliability. For example, a product may only last for one year to prove that it can be used successfully for the next 12 years. Ensuring high reliability when designing the latest products is an engineering challenge. And in the area of product reliability, statistical methods play an important role.
Modern product design and manufacturing uses a proactive design process called "Reliability by Design" or "Design for Reliability". In such a process, quantitative methods for providing early information on the cause of failure, methods for evaluating and predicting product reliability, and timely acquisition of the most meaningful data for analysis. Careful planning is required. In this talk, we will introduce statistical methods for reliability and how JMP is useful for developing reliable products.
[Presenter Profile]
Dr. Bill Meeker is a professor of statistics at Iowa State University and a Distinguished Professor at the College of Liberal Arts. He is a Fellow of the American Statistical Association (ASA) and the American Quality Society (ASQ) and a former editor of Technicals magazine. He has co-authored numerous books, including "Statistical Methods for Reliability Data" (1998, co-authored with Luis Escobar) and "Statistical Intervals: A Guide for Practitioners" (co-authored with Gerald Hahn, 1991). increase. He has also published numerous articles in engineering and statistics-related literature. He has won the ASQ Youden Award four times and the Wilcoxon Award three times. In 2001, he received the ASA Best Practical Application Award, and in 2003, he received the WG Hunter Award in the ASQ Statistics category. In 2007, he was awarded the ASQ Shewhart Medal. Dr. Meeker conducts extensive research and consulting on issues such as reliability data analysis, reliability test planning, accelerated testing, nondestructive evaluation, and statistical calculations.
・ Special dialogue (Japanese)
・ Keynote speech (Japanese)
・ Special dialogue (English)
・ Keynote speech (English)
I link some references herein which Dr. William Meeker either spoke of (or are connected to what he spoke of) in conversation with Chris Gotwalt in the "Special Dialogue" accompanying this presentation:
Interesting chat! Especially enjoyed the distinction between "information" and "data" as this is particularly apt for practitioners (data analysts) in applied industries. Also the discussion on Bayesian Methods and their practical utility in the presence of very limited information. This distinction between "enumerative and analytic studies" in the context Deming's language and how the assumptions about the inferences made on the data may be different depending on the data generating process.
