The Distribution platform of JMP can give you a calculation of the confidence interval of a binomial distribution (ex. pass/fail). But when you want to get CI's of probabilities across another categorical factor, the Fit Y by X and Graph Builder platforms do not have the option to provide these values. This capability would be particularly useful in situations where you want to see if yields are statistically different across categorical variables (ex. if different lots/wafers have statistically lower yields). It would be nice if graph builder could plot a column of pass/fail values across another categorical col (ex. Lot/Wafer) and show the probability of pass (ie. yield) as a marker with a confidence interval line going through the marker. This would allow the user to easily identify which categorical levels have statistically lower yields in a nice Graph Builder visual. A similar view could be done for Fit Y by X as well.
In the past I've had to do this in Distribution with a By variable, turn on the confidence intervals, then right-click the CI table and Make Combined Data Table, then plot the results from that table which is a clunky process, especially for those not familiar with those options in JMP.
