Say I measured defect for a wafer twice, and have X, Y axis data for each defect.
Some defects are repeat defect, they have very similar axis data (although not exact the same), so I would put "repeat" tag for them, while some defect do not have match, so I would put "new" tag for them.
How do I write a formula to automatically do this? (ie: formula to auto make column "judge base on after")
(Note that for same defect, values are not exact the same, just very close. And same defect could be in different row for before & after)
| X-Before | Y-Before | X-After | Y-After | judge base on after |
| -446659 | 888856 | -446649 | 888852 | Repeat |
| -445908 | 630775 | -445899 | 630772 | Repeat |
| -447462 | 301534 | -446122 | 588199 | new |
| -140914 | 508425 | -447456 | 301532 | Repeat |
| | | -140907 | 508433 | Repeat |