Hi All,
I am planning to evaluate a new process which is supposed have a better defectivity performance (semiconductor industry). The question that I have is lets say that my process failure is not repeatable during a certain runs of experiment. For example in my 100 wafers run, i have observed that the failure happens on the 20th and 50th wafer run. A repeat on another 100 wafers run the failure happen on the 10th, 31st and 70th wafers. In this situation how do I design my experiment in order to determine whether my new process does indeed improves the defectivity of my baseline process
Hope someone is able to help me on this
Rgrds
Irfan