Has anyone ever created an ellipsometric trajectory for del, psi, wavelength, n, k, and/or thickness on JMP?
Thanks!
FWIW, I'm not aware of one (but that doesn't necessarily mean 'no').
I'm assuming that you want something like this. Are you able to share any data? Then someone might be able to try out a few things.
I have never tried to do the ellipsometric analysis in JMP ... it has never seemed worthwhile to try to replicate/replace WVASE or now CompleteEASE software. What I typically do is to export the data from CompleteEASE and then use Functional Data Explorer in JMP Pro to analyze my experiments.
