Use case:
35,000 defects detected by a machine on one wafer. An operator samples 1500 images and sorts them into 10 categories. The percentages of the defect categories are meant to reflect the defects in the population of 35,000. In this case 1500 images were used but what happens when the 5000 images are used?
What does that do to the confidence intervals on the proportions. As the sampling gets low, some of the low proportions will not be detectible. How does one determine the lowest detectible proportion for a given samples size.
Any ideas if there any calculators or tools that can help with this?