Level: Intermediate
【Presenter】
Motohisa Hirono, HC Business Headquarters with Business Promotion Center, Ricoh Co., Ltd.
Yukio Endo, Discrete Semiconductor Reliability Technology Department, Discrete Semiconductor Reliability Technology Department, Toshiba Electronic Devices & Storage Corporation
[Announcement summary]
We will introduce a case study of reliability data analysis, focusing on the story of Weibull analysis using Weibull probability paper used in reliability engineering. Reliability data is often misinterpreted depending on the processing. Continuing from last year, this presentation will introduce the points of correct usage of data analysis using JMP with demonstrations while comparing with existing methods.
[Presenter Profile]
Motohisa Hirono
Joined Ricoh Co., Ltd. in 1984. Since then, he has been engaged in in-house quality management and reliability management work, and enlightenment and dissemination of statistics. After working as the director of the QM Promotion Office of the Quality Headquarters and the director of the SF Business Center, he is in his current position. Tokyo University of Science Faculty of Engineering (1997-1998), Keio University Faculty of Policy Management Part-time Lecturer (2000-2004). His main specialties are statistical quality control and reliability engineering. Major works include "Practice of Graphical Modeling", "How to Use Multivariate Data with JMP", "23 Statistical Calculation Methods Learned from Anscombe's Numerical Examples", "Multivariate Analysis for Engineers with JMP", There is "multivariate analysis of scales from the eyes".
Yukio Endo
Joined Toshiba Corporation in 1987. After product development and process development of power ICs (power supply ICs, 500V withstand voltage driver ICs for motors, etc.), he is currently engaged in failure analysis technology development. Ph.D. (Information Science) Osaka University.
* There are no handouts.
