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Tracking and Trending Manufacturing Metrics
gail_massari
See how to:
Understand how control charts to identify special causes of variation.
Build charts using Control Chart Builder
Save Control Charts to PowerPoint
See how to:
Build IR Charts
Avoid issues related to missing values
Limit data points to improve readability
Automate reproducing your work using scripts created by JMP and by implementing techniques to make the x-axis scaling dynamic
See how to:
Use two different approaches for handling control limits
Use and reuse the same fixed limits based on best case when the process was in control
Calculate limits each time you have new data
Save control limits both to the column and to a new table
Add control limits from a limits table to a table containing the variables for the control charts
See how to:
Use JMP Profilers to find settings that will result in the lowest probability of defects
Model the process and compare maximized process settings to those for minimized defects
Resources
Constructing p-charts or Laney p-charts in JMP
Understanding Statistical Process Control
, Donald Wheeler, 2010
Statistical Quality Control
, Douglas Montgomery, 2012
Tracking and Trending July 27 2019.jrn
Tracking and Trending Manufacturing Metrics July 2018.pdf
Byron Manufacturing Metrics.zip
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