312406_en-US
Pinpointing and Reducing Defects
See how to:
- Reduce spatial defect data to a few key clusters
- Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements
See how to:
- Examine multildimensional defects by going from a 2D to a 3D view of the defect
- Visually explore 3D views using Scatterplot 3D
Resources16-30 min6-15 minBasicMastering JMP
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