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Pinpointing and Reducing Defects
gail_massari
See how to:
Reduce spatial defect data to a few key clusters
Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements
See how to:
Examine multildimensional defects by going from a 2D to a 3D view of the defect
Visually explore 3D views using Scatterplot 3D
Resources
Clustering videos
Multivariate analysis and clustering videos
Background on Hough Transform feature extraction technique
JMP Semiconductor Tool Kit Add-In for creating wafer maps
Discovery Summit Video: All Wafer Maps Are Wrong: An Adventure in Semiconductor Data Visualization
Mastering JMP Spatial Defects.pptx
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