How to deal with time-dependent factors
I am designing an experiment in a semiconductor context. Briefly: the performance (i.e. etched material) of a tool (CMP - chemical mechanical polishing) used in the manufacturing of silicon wafers strongly depends on the lifetime of certain consumable parts - i.e. carrier and pad. These parts get consumed quite independently from one another and once they reach a target lifetime, they get replaced. Unfortunately we believe that also some other factors linked to the fabrication of each sample of these parts and not only to the lifetime can affect performance of CMP, such that two physically different carriers with same lifetime can have different impact on response.
The purpose of the study would be to link the performance of CMP to the lifetime of these parts (which would be quite easy) but taking into account the random variation coming from part-to-part construction differences. The main challenge is that lifetime of a given part can only increase with time, so full randomization is not possible. To explain: I cannot perform the initial runs with fresh carrier, perform other runs with the same carrier near lifetime end and finish the experiment with the fresh carrier! On the other hand, if I physically change the part , I'm afraid to confuse response with other factors coming from part-to-part variation.
I felt initially that split-plot design would help, but I cannot address the above issue within this frame. Let me also add that changing these parts is quite time consuming and expensive, therefore minimization of changes is part of the challenge.
I also read some interesting advice by Bradley Jones dated 2012 in the JMP Blog about using time as covariate, but my case above seems to be a bit more convoluted than the one presented in that post.
It would be really nice if JMP could take into account the kind of constraints I've described above.
I hope my description is clear enough, any suggestion would be appreciated!
thanks
Matteo