The request is to have the ability to use two x variables for the functional data explorer platform. You would have to have basis shapes instead of functions to map out a surface. It might be too computationally intensive, but I think it would be very popular. An example application is looking at deposition parameters in a semiconductor coating application to see how they impact the surface morphology.
I have heard this request from Exxon, Micron, Intel, and P&G.
