彼得·赫什費甚 JMP Systems Engineer的工程師展示了測量系統分析(MSA)技術(包括量規R&R),評估測量過程(EMP)以及如何將控製圖生成器用於統計過程控制(SPC)。
<script>LITHIUM.OoyalaPlayer.addVideo('https:\/\/player.ooyala.com\/static\/v4\/production\/', 'lia-vid-p3ZHEzODE6kfiK_O0RUYCTcMn1O11bk8w400h300r949', 'p3ZHEzODE6kfiK_O0RUYCTcMn1O11bk8', {"pcode":"ltbGkyOjMl3V3pZ3Trn6T2z1_rjF","playerBrandingId":"ODI0MmQ3NjNhYWVjODliZTgzY2ZkMDdi","width":"400px","height":"300px"}); (在“我的視頻”中查看)