<meta http-equiv="Content-Type" content="text/html; charset=UTF-8" />C30 JMP DOE Covering Array (Koprowski / Perkinson)
Authors: Stan Koprowski and Jeff Perkinson
Background: The JMP user community was recently under attack by spam. The community was updated to a newer version of the software. The upgrade caused erroneous menu titles to be displayed.
DOE Design Covering Array
Covering arrays are used in testing deterministic systems where failures occur as a result of interactions among components or subsystems.
The design goal is to reveal if any interaction induces a failure in the system.
· Identify failures due to interaction with deterministic systems.
· Create candidate model to allow further component testing.
· Simplify and speed up process for identification of component failures.
Why Good: Good real-world example to illustrate the usefulness of covering arrays to help identify software failures.
Scripts:
DOE dialog
Covering Array analysis
Files Attached (7):
- DOE Covering Array.jmp
- DOE Covering Array Journal
- Screen capture highlighting the problem
- Screen capture of the corrected menus after the fix was applied
- Screen capture of the actual directory structure (theme)
- Screen capture of DOE Covering Array with Candidate Factors
- Screen capture of the Summary Outline / Failure Analysis
