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Yield Visualization with Custom Maping in Wafer Map

Hi All,

I put together an example of using custom maping to highlight spatial defects in semiconductor floorplans and wafer maps.

This technique was previously presented at Discovery 2015:

https://community.jmp.com/t5/Discovery-Summit-2015/System-on-Chip-SOC-Yield-Visualization-Using-Custom-Heat-Maps-in/ta-p/22797

This can be used as method to showcase JMP's ability to identify, both visually and interactively, spatial signatures within your data.

Install Notes:

Before opening "IC_Floorplan.jmp" install the files below in the "Maps" folder where JMP is locally installed, (Ex: C:\Program Files\SAS\JMPPRO\13\Maps).