D66 Film Coating Defect Data (Anderson & Bartell)Title: Film Coating Defect Data
Author(s): Mike Anderson and Peter Bartell
Description: A data set for use with the Hierarchical Clustering with Spatial Measures option. The data set is synthetic and may be freely used and distributed. The data approximates a series of long substrates that are passed through a cascade of a liquid coating. The substrates are then scanned for defects in the coating via an optical scanner in transmission mode. Each substrate (denoted by the image column in the data) is 1397mm x 1524000mm. The optical scanner bins the image data down such that each row of data accounts for 1219mm by 11.6mm - resulting in an image that is 1250px x 120px. Each film has white noise added to further complicate the analysis. The goal is to locate the linear defects in the film coating using the Hierarchical Clustering Platform and the spatial measures option. Scripts for visualization of the problem and the finished analysis are included.
Files:
- Narrative.doc: a detailed description of the process and relevant background information.
- Film_small.jmp: the data file.
- Film.small.tiff: an image stack of the optical scanner output for the different runs
Data TablesMastering JMP
